发明名称 Semiconductor device and method for forming the same
摘要 In fabricating a thin film transistor, an active layer comprising a silicon semiconductor is formed on a substrate having an insulating surface. Hydrogen is introduced into The active layer. A thin film comprising SiOxNy is formed to cover the active layer and then a gate insulating film comprising a silicon oxide film formed on the thin film comprising SiOxNy. Also, a thin film comprising SiOxNy is formed under the active layer. The active layer includes a metal element at a concentration of 1×1015 to 1×1019 cm−3 and hydrogen at a concentration of 2×1019 to 5×1021 cm−3.
申请公布号 US8330165(B2) 申请公布日期 2012.12.11
申请号 US20090483311 申请日期 2009.06.12
申请人 TERAMOTO SATOSHI;SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TERAMOTO SATOSHI
分类号 H01L29/10;H01L21/336;H01L29/49;H01L29/786 主分类号 H01L29/10
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