| 摘要 |
<P>PROBLEM TO BE SOLVED: To effectively detect nonuniformities or other less-visible defects that occur during manufacturing an optical film. <P>SOLUTION: The film defect monitoring device includes: an image acquiring module that acquires images on a film at every predetermined period, on a top surface of the film conveyed in one direction; an image processing module that layers two or more images selected among from the images acquired in the image acquiring module, and amplifies the luminance of the layered images; and an output module that displays the images layered and amplified in the image processing module, on a screen. <P>COPYRIGHT: (C)2013,JPO&INPIT |
