| 摘要 |
<p>A method of measuring non-linearity specification of an analog-to-digital converter (ADC) is provided, characterized in that, measuring of deviation of observed output code distribution from an ideal distribution by providing a custom piecewise linear ramp input waveform to the analog to digital converter and providing a reference input and a clock input to the analog to digital converter, the method includes the steps of generating a plurality of analog to digital converter output codes based on the custom ramp input waveform, storing a plurality of output codes, analyzing the plurality of output codes, reporting maximum differential non- linearity values for each output code and identifying the maximum value of differential non- linearity based on a plot of analog input versus differential non-linearity values for each output code generated from the input ramp waveform.</p> |
