A DETECTING METHOD AND A DETECTING SYSTEM FOR AN ARRAY SUBSTRATE

摘要

A detecting method and a detecting system for an array substrate are provided. The detecting method comprises: supplying power to at least one type of controlling signal lines on the array substrate and lasting for a preset time; sensing the temperature of the controlling signal lines supplied with power by a thermograph (30) and recording a temperature sensing result, forming an infrared thermogram after the thermograph (30) senses the temperature of the controlling signal lines; and determining abnormal temperature data according to the color of the image in the infrared thermogram, with the dots on the controlling signal lines corresponding to the abnormal temperature data as defective dots. The detecting method and the detecting system for the array substrate can detect the interior defects of the controlling signal lines on the array substrate, thereby preventing defective products from entering subsequent processes.