Prediction of wax appearance temperature and solid wax amount by reduced spectral analysis using FTIR spectroscopy

摘要

A method that uses corrected areas integrated at two different wavelength ranges, 1402-1324 cm−1 and 735-715 cm−1. The invention uses the reduced form of FTIR spectral integration. The invention provides reliable data in the variety of applications regardless of FTIR spectral instability occurring unexpectedly, such as loading sample thickness, sample cell location changes of FTIR light source passes, volume changes during cooling procedure, existence of emulsified water, moisture building on the surface of FTIR crystals.