发明名称 |
Method and apparatus for detecting and passivating defects in thin film solar cells |
摘要 |
The embodiments of the present invention provide a defect detection process and apparatus to detect defects in solar cell structures. During the process, an input signal from a signal source is applied to a top surface of a transparent conductive layer of a solar cell structure. In response to the input signal, an output signal is generated from a predetermined area of the top surface and detected by a defect detector. The output signal carrying the defect position information is transmitted to a computer and registered in a database. With the position information, an injector is driven to the defect location to apply an insulator to passivate the defect. A finger pattern layer may be formed over the predetermined area after completing the defect detection and passivation processes. |
申请公布号 |
US8318239(B2) |
申请公布日期 |
2012.11.27 |
申请号 |
US20080272499 |
申请日期 |
2008.11.17 |
申请人 |
BASOL BULENT M.;SOLTZ DAVID;SOLOPOWER, INC. |
发明人 |
BASOL BULENT M.;SOLTZ DAVID |
分类号 |
B05D5/06 |
主分类号 |
B05D5/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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