| 摘要 |
A method of measuring resistance in each of a plurality of resistors in a resistor matrix is provided. Each resistor is located at a different intersection between a column conductor and a row conductor. The, the method includes determining an offset error row current of each row conductor, scanning each row conductor to identify if that row conductor is connected to a column conductor by one of the plurality of resistors, if that row conductor is connected to a column conductor by one of the plurality of resistors, scanning each resistor connected to that row conductor to determining if that resistor is connecting a column conductor to that row conductor, and if that resistor is connecting a column conductor to that row conductor, outputting an offset compensated resistance of that resistor calculated from the row current measured for that resistor less the offset error row current for that row conductor.
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