发明名称 LOCAL INTERCONNECT STRUCTURE SELF-ALIGNED TO GATE STRUCTURE
摘要 <p>A common cut mask is employed to define a gate pattern and a local interconnect pattern so that local interconnect structures and gate structures are formed with zero overlay variation relative to one another. A local interconnect structure may be laterally spaced from a gate structure in a first horizontal direction, and contact another gate structure in a second horizontal direction that is different from the first horizontal direction. Further, a gate structure may be formed to be collinear with a local interconnect structure that adjoins the gate structure. The local interconnect structures and the gate structures are formed by a common damascene processing step so that the top surfaces of the gate structures and the local interconnect structures are coplanar with each other.</p>
申请公布号 WO2012154228(A1) 申请公布日期 2012.11.15
申请号 WO2012US21417 申请日期 2012.01.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;KHAKIFIROOZ, ALI;CHENG, KANGGUO;DORIS, BRUCE, B.;HAENSCH, WILFRIED, E.;HARAN, BALASUBRAMANIAN, S.;KULKARNI, PRANITA 发明人 KHAKIFIROOZ, ALI;CHENG, KANGGUO;DORIS, BRUCE, B.;HAENSCH, WILFRIED, E.;HARAN, BALASUBRAMANIAN, S.;KULKARNI, PRANITA
分类号 H01L21/28;H01L21/336;H01L29/78 主分类号 H01L21/28
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