发明名称 PATTERN FORMING METHOD
摘要 According to one embodiment, an opening pattern is formed in the core film above a processing target, and a mask film is conformally formed above the processing target. Next, etch-back of the mask film is performed so that the mask film remains on a side surface of the core film. After that, line-and-space shaped core patterns, made of the core film, is formed in an area other than an area forming the opening pattern. Next, sidewall patterns are formed around the core patterns, and the core patterns are removed. Next, the processing target is patterned by using the mask film and the sidewall patterns.
申请公布号 US2012289039(A1) 申请公布日期 2012.11.15
申请号 US201213364624 申请日期 2012.02.02
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAJIWARA SEIJI
分类号 H01L21/8239 主分类号 H01L21/8239
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