发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device which improves the connection reliability when different kinds of semiconductor chips are laminated. <P>SOLUTION: A manufacturing method of a semiconductor device includes: a step where a chip lamination body 3A formed by laminating multiple semiconductor chips 11a to 11e is produced while joining connection terminals 12a, 12b of multiple semiconductor chips 11a to 11b to each other through thermocompression bonding; and a step where the chip lamination body 3A is sealed with an underfill material 4 by thermally hardening the underfill material 4 after filling the underfill material 4 into clearances of the multiple semiconductor chips 11a to 11e. A temperature of the chip lamination body 3A is maintained at a predetermined temperature or higher between the step where the chip lamination body 3A is produced and the step where the chip lamination body 3A is sealed by the underfill material 4. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012212786(A) 申请公布日期 2012.11.01
申请号 JP20110077738 申请日期 2011.03.31
申请人 ELPIDA MEMORY INC 发明人 NAKANOYA YUSUKE;YOSHIDA MASANORI;KUSANAGI KEISUKE
分类号 H01L25/065;H01L25/07;H01L25/18 主分类号 H01L25/065
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