发明名称 Method of testing anti-high temperature performance of a magnetic head and apparatus thereof
摘要 A method of testing anti-high temperature performance of a magnetic head comprises applying a second magnetic field with different intensities in a second direction and the changing first magnetic fields in a first direction, and measuring a plurality of second output parameter curves; and judging whether a variation that is beyond an allowable value is presented on the second output parameter curves, thereby screening out a defective magnetic head, therein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head and with high precision.
申请公布号 US2012274317(A1) 申请公布日期 2012.11.01
申请号 US201113064994 申请日期 2011.04.29
申请人 LUENG CHIUMING;LUI CHEUKMAN;LEE MANKIT;LAM HOKEI;LEUNG KWOKKAM;LEUNG CHEUKWING;DING JUREN;NI RONGKWANG;SAE MAGNETICS (H.K.) LTD. 发明人 LUENG CHIUMING;LUI CHEUKMAN;LEE MANKIT;LAM HOKEI;LEUNG KWOKKAM;LEUNG CHEUKWING;DING JUREN;NI RONGKWANG
分类号 G01R33/12 主分类号 G01R33/12
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