| 摘要 |
A defect detecting method of a display device includes a defect counting process that measures a feature amount for each partial region of a display device (P32), and counts regions which is determined as a defective portion based on the measured feature amount of the region (P36), a process that stops a manufacturing line of the display device when a number of defects counted at the defect counting process is greater than a first threshold value (P38, P42), a defect density calculating process that calculates a defect density in a predetermined area when the number of defects counted at the defect counting process is smaller than the first threshold value (P38), and a process that stops the manufacturing line of the display device when the defect density calculated at the defect density calculating process is higher than a second threshold value (P40, P42). |
