发明名称 Semiconductor device having IGBT and FWD on same substrate
摘要 A semiconductor device includes: a semiconductor substrate; an IGBT element including a collector region; a FWD element including a cathode region adjacent to the collector region; a base layer on the substrate; multiple trench gate structures including a gate electrode. The base layer is divided by the trench gate structures into multiple first and second regions. Each first region includes an emitter region contacting the gate electrode. Each first region together with the emitter region is electrically coupled with an emitter electrode. The first regions include collector side and cathode side first regions, and the second regions include collector side and cathode side second regions. At least a part of the cathode side second region is electrically coupled with the emitter electrode, and at least a part of the collector side second region has a floating potential.
申请公布号 US8299539(B2) 申请公布日期 2012.10.30
申请号 US20090588310 申请日期 2009.10.13
申请人 KOUNO KENJI;DENSO CORPORATION 发明人 KOUNO KENJI
分类号 H01L27/06 主分类号 H01L27/06
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