发明名称 INDUCTIVELY COUPLED PLASMA PROCESSING APPARATUS
摘要 PURPOSE: An inductively coupled plasma processing apparatus is provided to prevent damage to a dielectric by dispersing stress added to the dielectric. CONSTITUTION: A chamber body(110) has an opening formed on an upper portion. A dielectric(150) is installed in order to cover the opening of the chamber body. The dielectric includes one or more through holes(210). A substrate supporter(130) is installed to the chamber body in order to support a substrate(10). An antenna(160) is installed on an upper portion of the dielectric in order to form an induction field in a process space. A ceiling portion(170) is arranged on the upper portion of the chamber body. A plurality of dielectric supporting members(220) is inserted into a through hole(210) of the dielectric. The plurality of dielectric supporting members is combined with the ceiling portion in order to support the dielectric.
申请公布号 KR20120117484(A) 申请公布日期 2012.10.24
申请号 KR20110035265 申请日期 2011.04.15
申请人 WONIK IPS CO., LTD. 发明人 CHO, SAENG HYUN;LEE, HYANG JOO;KIM, JIN HONG
分类号 H05H1/46;H01L21/205;H01L21/3065 主分类号 H05H1/46
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