发明名称 |
INDUCTIVELY COUPLED PLASMA PROCESSING APPARATUS |
摘要 |
PURPOSE: An inductively coupled plasma processing apparatus is provided to prevent damage to a dielectric by dispersing stress added to the dielectric. CONSTITUTION: A chamber body(110) has an opening formed on an upper portion. A dielectric(150) is installed in order to cover the opening of the chamber body. The dielectric includes one or more through holes(210). A substrate supporter(130) is installed to the chamber body in order to support a substrate(10). An antenna(160) is installed on an upper portion of the dielectric in order to form an induction field in a process space. A ceiling portion(170) is arranged on the upper portion of the chamber body. A plurality of dielectric supporting members(220) is inserted into a through hole(210) of the dielectric. The plurality of dielectric supporting members is combined with the ceiling portion in order to support the dielectric.
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申请公布号 |
KR20120117484(A) |
申请公布日期 |
2012.10.24 |
申请号 |
KR20110035265 |
申请日期 |
2011.04.15 |
申请人 |
WONIK IPS CO., LTD. |
发明人 |
CHO, SAENG HYUN;LEE, HYANG JOO;KIM, JIN HONG |
分类号 |
H05H1/46;H01L21/205;H01L21/3065 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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地址 |
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