发明名称 Mask blank and method of manufacturing an imprint mold
摘要 Provided is a method of manufacturing an imprint mold formed with a highly accurate fine pattern by the use of a mask blank. In a mask blank having a thin film for forming a pattern on a transparent substrate, the thin film comprises an upper layer formed of a material containing Cr and nitrogen and a lower layer formed of a material containing a compound mainly composed of Ta and capable of being etched by dry etching using a chlorine-based gas. The upper layer and the lower layer of the thin film are etched by dry etching using a chlorine-based gas substantially free of oxygen and then the substrate is etched by dry etching using a fluorine-based gas, thereby obtaining an imprint mold.
申请公布号 US8273505(B2) 申请公布日期 2012.09.25
申请号 US20080680355 申请日期 2008.09.26
申请人 SATO TAKASHI;KUREISHI MITSUHIRO;HOYA CORPORATION 发明人 SATO TAKASHI;KUREISHI MITSUHIRO
分类号 G03F1/22;B29C33/38;B29C59/02;B81C99/00;G03F1/50;G03F1/54;G03F1/68;G03F1/80;H01L21/027 主分类号 G03F1/22
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