发明名称 Power measurement techniques of a system-on-chip (SOC)
摘要 A method and system to enable power measurements of a system-on-chip in various modes. In one embodiment of the invention, the system-on-chip has full controllability of its logic and circuitry to facilitate configuration of the system-on-chip into a desired mode of operation. This allows hooks or interfaces to access the system-on-chip externally for measurements. For example, in one embodiment of the invention, the hooks in the system-on-chip allow a backend tester to configure the system-on-chip into various modes easily to perform power consumption measurements of one or more individual components of the system-on-chip. The power consumption measurement of the individual components in the system-on-chip can be performed faster and can be more accurate. In addition, the overall yield of the SOC can be increased as it is easier to detect failure parts.
申请公布号 US8275560(B2) 申请公布日期 2012.09.25
申请号 US20090557263 申请日期 2009.09.10
申请人 RADHAKRISHNAN SIVAKUMAR;TAN SIN S.;JOURDAN STEPHAN J.;LOOI LILY P.;LIU YI-FENG;INTEL CORPORATION 发明人 RADHAKRISHNAN SIVAKUMAR;TAN SIN S.;JOURDAN STEPHAN J.;LOOI LILY P.;LIU YI-FENG
分类号 G01R15/00;G01R19/00;G01R21/00;G06F1/00 主分类号 G01R15/00
代理机构 代理人
主权项
地址