| 摘要 |
<p>A condition input device inputs measurement conditions and information about an electronic device to be measured. A measurement operation program device selects a program for performing measurement operations on the electronic device according to the information to be measured and the measurement conditions. A voltage measurement device measures voltage fluctuations produced in a power source from the electronic device. A waveform arithmetic device carries out arithmetic processing such as filter processing, and time-frequency conversion (for example, the Fourier Transform) on the measured voltage fluctuations, and obtains the frequency characteristics of the voltage fluctuations. An impedance calculation device calculates impedance from the frequency characteristics of the voltage fluctuations, the frequency characteristics of the current, and the measurement operation program conditions.</p> |
