发明名称 METHOD FOR WAFER DICING AND DRILLING THROUGH ANISOTROPIC ETCHING AFTER LOCAL AMORPHIZATION USING LASER BEAM
摘要 PURPOSE: An anisotropic etching method and a dicing and drilling method using the same are provided to prevent the chipping of a wafer in the dicing and drilling operations. CONSTITUTION: A coating layer(20) is formed on one side of a wafer(10). The wafer is comprised of silicon or sapphire. The coating layer is eliminated by radiating laser. An establishment portion of the thickness of the wafer becomes amorphous material. A laser machining portion of the wafer is etched. The coating layer is one among a photosensitive polymer, a silicon nitride, and a silicon oxide.
申请公布号 KR20120102897(A) 申请公布日期 2012.09.19
申请号 KR20110020782 申请日期 2011.03.09
申请人 KOREA INSTITUTE OF MACHINERY & MATERIALS 发明人 SHIN, DONG SIG;SUH, JEONG;CHOI, SANG KYU
分类号 H01L21/78;H01L21/301 主分类号 H01L21/78
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