发明名称 Metrology system and method applied to an interferometer for remote analysis of a gaseous compound
摘要 <p>The system has a laser beam acquisition subsystem with a convergent lens (48) and a detection subsystem (49) to provide laser signals (400) representing measurement of interference of a metrology laser beam (41) after passing via an interferometer (40). A metrology unit generates synthetic metrology signals for different points of a field of view of the interferometer from the laser signals, where the metrology signals take into account a trajectory of mobile retroreflectors (3) in a space. The unit has a metrology calculation component to estimate differences of absolute optical path lengths. An independent claim is also included for a metrology method for remote analysis of a gaseous compound.</p>
申请公布号 EP2500701(A1) 申请公布日期 2012.09.19
申请号 EP20120159489 申请日期 2012.03.14
申请人 THALES 发明人 GAUCEL, JEAN-MICHEL;MIRAS, DIDIER
分类号 G01J3/453;G01B9/02 主分类号 G01J3/453
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