发明名称 |
Metrology system and method applied to an interferometer for remote analysis of a gaseous compound |
摘要 |
<p>The system has a laser beam acquisition subsystem with a convergent lens (48) and a detection subsystem (49) to provide laser signals (400) representing measurement of interference of a metrology laser beam (41) after passing via an interferometer (40). A metrology unit generates synthetic metrology signals for different points of a field of view of the interferometer from the laser signals, where the metrology signals take into account a trajectory of mobile retroreflectors (3) in a space. The unit has a metrology calculation component to estimate differences of absolute optical path lengths. An independent claim is also included for a metrology method for remote analysis of a gaseous compound.</p> |
申请公布号 |
EP2500701(A1) |
申请公布日期 |
2012.09.19 |
申请号 |
EP20120159489 |
申请日期 |
2012.03.14 |
申请人 |
THALES |
发明人 |
GAUCEL, JEAN-MICHEL;MIRAS, DIDIER |
分类号 |
G01J3/453;G01B9/02 |
主分类号 |
G01J3/453 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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