| 摘要 |
Circuits and methods to compensate for defective memory in BEOL third dimensional memory technology are described. An integrated circuit is configured to perform columnar replacement of defective BEOL multi-layered memory. For example, the integrated circuit can include a primary BEOL memory array having a plurality of BEOL memory cells being configured to change resistivity, a secondary BEOL memory array having another plurality of BEOL memory cells being configured to change resistivity, and a FEOL restoration module associated with the primary BEOL memory array and the secondary BEOL memory array, the FEOL restoration module being configured to locate a BEOL memory cell within the secondary BEOL memory array to replace a defective BEOL memory cell within the primary BEOL memory array. The FEOL portion can be fabricated on a substrate and the BEOL portion can be fabricated above and in contact with the FEOL portion to form the integrated circuit. |
