发明名称 METHOD FOR FORMING SEMICONDUCTOR DEVICE WITH TSV
摘要 PURPOSE: A method for forming a semiconductor device equipped with a penetrating electrode is provided to secure overlay margins between a connection terminal and the penetrating electrode by controlling a short circuit between a silicon substrate and a bump when the bump is connected to the penetrating electrode. CONSTITUTION: A penetrating electrode hole(201) is formed on the front side of a semiconductor substrate(100). The penetrating electrode hole is filled with a first insulation layer. An insulation tube(305) is formed by selectively etching the center portion of the first insulation layer. An inner space of the insulation tube is filled with a penetrating electrode. The bottom of the penetrating electrode is exposed by grinding the rear side of the semiconductor substrate. A connection terminal is formed on the exposed bottom of the penetrating electrode.
申请公布号 KR101179271(B1) 申请公布日期 2012.09.03
申请号 KR20110019026 申请日期 2011.03.03
申请人 SK HYNIX INC. 发明人 OH, JOON SEOK;KIM, CHAN BAE;LEE, JEONG YEOP
分类号 H01L21/60;H01L23/045;H01L23/055;H01L23/48 主分类号 H01L21/60
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