发明名称 |
METHOD FOR FORMING SEMICONDUCTOR DEVICE WITH TSV |
摘要 |
PURPOSE: A method for forming a semiconductor device equipped with a penetrating electrode is provided to secure overlay margins between a connection terminal and the penetrating electrode by controlling a short circuit between a silicon substrate and a bump when the bump is connected to the penetrating electrode. CONSTITUTION: A penetrating electrode hole(201) is formed on the front side of a semiconductor substrate(100). The penetrating electrode hole is filled with a first insulation layer. An insulation tube(305) is formed by selectively etching the center portion of the first insulation layer. An inner space of the insulation tube is filled with a penetrating electrode. The bottom of the penetrating electrode is exposed by grinding the rear side of the semiconductor substrate. A connection terminal is formed on the exposed bottom of the penetrating electrode.
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申请公布号 |
KR101179271(B1) |
申请公布日期 |
2012.09.03 |
申请号 |
KR20110019026 |
申请日期 |
2011.03.03 |
申请人 |
SK HYNIX INC. |
发明人 |
OH, JOON SEOK;KIM, CHAN BAE;LEE, JEONG YEOP |
分类号 |
H01L21/60;H01L23/045;H01L23/055;H01L23/48 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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