发明名称
摘要 <p>In order to clean optical components (35) inside an EUV lithography device in a gentle manner, a cleaning module for an EUV lithography device includes a supply line for molecular hydrogen and a heating filament for producing atomic hydrogen and hydrogen ions for cleaning purposes. The cleaning module also has an element, (33) arranged to apply an electric and/or magnetic field, downstream of the heating filament (29) in the direction of flow of the hydrogen (31, 32). The element can be designed as a deflection unit, as a filter unit and/or as an acceleration unit for the ion beam (32).</p>
申请公布号 JP5010047(B2) 申请公布日期 2012.08.29
申请号 JP20110500136 申请日期 2009.02.05
申请人 发明人
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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