发明名称 Semiconductor structure, method for operating a semiconductor structure and method for producing a semiconductor structure
摘要 A semiconductor structure has a substrate with a first main surface and a second main surface, the substrate comprising a gate electrode region, a channel region, wherein a conductive channel can be generated, and a gate electrode insulation between the gate electrode region and the channel region. Further, a field electrode region with a curved external surface is provided for increasing a breakdown voltage of the semiconductor structure, wherein the field electrode region has an extension in every direction in parallel to the first main surface, which is lower than a maximum extension in the one direction perpendicular to the second main surface.
申请公布号 US8247865(B2) 申请公布日期 2012.08.21
申请号 US20060543732 申请日期 2006.10.05
申请人 HIRLER FRANZ;INFINEON TECHNOLOGIES AUSTRIA AG 发明人 HIRLER FRANZ
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
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