发明名称 METHOD OF CONTROLING SUBSTRATE PROCESSING APPARATUS
摘要 PURPOSE: A method for controlling a substrate processing device is provided to automatically calculate a voltage value corresponding to a target amount of discharged liquid crystals, thereby efficiently controlling the amount of discharged liquid crystals. CONSTITUTION: A change value of the amount of discharged liquid crystals is measured according to various voltage change values. Correlation data are generated(S110). Linear regression analysis of the correlation data is performed. A correlation equation of the amount of discharged liquid crystals is obtained about the voltage value(S120). A necessary voltage value about a target amount of discharged liquid crystals is calculated by the correlation equation(S130).
申请公布号 KR20120090423(A) 申请公布日期 2012.08.17
申请号 KR20110010842 申请日期 2011.02.08
申请人 SEMES CO., LTD. 发明人 OH, BEOM JEONG;NAM, KI SEON
分类号 G02F1/1341;B05C5/02;G02F1/13 主分类号 G02F1/1341
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