发明名称 |
METHOD OF CONTROLING SUBSTRATE PROCESSING APPARATUS |
摘要 |
PURPOSE: A method for controlling a substrate processing device is provided to automatically calculate a voltage value corresponding to a target amount of discharged liquid crystals, thereby efficiently controlling the amount of discharged liquid crystals. CONSTITUTION: A change value of the amount of discharged liquid crystals is measured according to various voltage change values. Correlation data are generated(S110). Linear regression analysis of the correlation data is performed. A correlation equation of the amount of discharged liquid crystals is obtained about the voltage value(S120). A necessary voltage value about a target amount of discharged liquid crystals is calculated by the correlation equation(S130). |
申请公布号 |
KR20120090423(A) |
申请公布日期 |
2012.08.17 |
申请号 |
KR20110010842 |
申请日期 |
2011.02.08 |
申请人 |
SEMES CO., LTD. |
发明人 |
OH, BEOM JEONG;NAM, KI SEON |
分类号 |
G02F1/1341;B05C5/02;G02F1/13 |
主分类号 |
G02F1/1341 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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