发明名称 TEST METHOD FOR AN ESCAPE ROUTE MARKING
摘要 <p>The invention relates to an escape route marking having an installation position and being illuminated by a light source in a defined position relative to the installation position in order to charge the escape route marking for an afterglow, characterized by the following method steps: an excitation curve ?(?) for the escape route marking is provided in dependence on the wavelength, the irradiance E(?) of the light source is captured for the installation position of the escape route marking in dependence on the wavelength, a weighted irradiance B(?) is ascertained as a product of the irradiance and the excitation curve in dependence on the wavelength, a charging irradiance (BiL) is ascertained as an integral over the weighted irradiance over the wavelength, and a characteristic curve Ktl (BiL), which is dependent on the charging time t1, indicates the resulting afterglow time for the escape route marking at the charging time t1 for the charging irradiance (BiL).</p>
申请公布号 CA2825383(A1) 申请公布日期 2012.08.09
申请号 CA20122825383 申请日期 2012.02.03
申请人 LUFTHANSA TECHNIK AG 发明人 BIEHL, TORBEN
分类号 G01J3/28;G01J1/18;G01J1/42;G01J1/58;G01J3/10;G01J3/44;G01N21/64 主分类号 G01J3/28
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