发明名称 |
Architecturally independent noise sensitivity analysis of integrated circuits having a memory storage device and a noise sensitivity analyzer |
摘要 |
Method of analyzing noise sensitivity of integrated circuits having at least one memory storage device and a noise sensitivity analyzer. In one embodiment, the noise sensitivity analyzer includes a circuit reservoir, a circuit parser and a circuit evaluator. The circuit reservoir is configured to receive and store a model of a circuit having at least one memory storage device to be analyzed. The circuit parser is configured to identify nodes of the model. The circuit evaluator is configured to apply a large test current to each of the nodes for multiple circuit states of the at least one memory storage device and determine which of the nodes are sensitive nodes. |
申请公布号 |
US8239801(B2) |
申请公布日期 |
2012.08.07 |
申请号 |
US20080347916 |
申请日期 |
2008.12.31 |
申请人 |
TURNER MARK F.;BROWN JEFF S.;SIMKO JOSEPH;VILCHIS MIGUEL A.;LSI CORPORATION |
发明人 |
TURNER MARK F.;BROWN JEFF S.;SIMKO JOSEPH;VILCHIS MIGUEL A. |
分类号 |
G06F17/50;G01R27/28;G06F9/455 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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