发明名称 Architecturally independent noise sensitivity analysis of integrated circuits having a memory storage device and a noise sensitivity analyzer
摘要 Method of analyzing noise sensitivity of integrated circuits having at least one memory storage device and a noise sensitivity analyzer. In one embodiment, the noise sensitivity analyzer includes a circuit reservoir, a circuit parser and a circuit evaluator. The circuit reservoir is configured to receive and store a model of a circuit having at least one memory storage device to be analyzed. The circuit parser is configured to identify nodes of the model. The circuit evaluator is configured to apply a large test current to each of the nodes for multiple circuit states of the at least one memory storage device and determine which of the nodes are sensitive nodes.
申请公布号 US8239801(B2) 申请公布日期 2012.08.07
申请号 US20080347916 申请日期 2008.12.31
申请人 TURNER MARK F.;BROWN JEFF S.;SIMKO JOSEPH;VILCHIS MIGUEL A.;LSI CORPORATION 发明人 TURNER MARK F.;BROWN JEFF S.;SIMKO JOSEPH;VILCHIS MIGUEL A.
分类号 G06F17/50;G01R27/28;G06F9/455 主分类号 G06F17/50
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