发明名称 Phase change memory device and method of manufacturing the same
摘要 A phase change memory device having a strain transistor and a method of making the same are presented. The phase change memory device includes a semiconductor substrate, a junction word line, switching diodes, and a strain transistor. The semiconductor substrate includes a cell area and a core/peri area. The junction word line is formed in the cell area of the semiconductor substrate and includes a strain stress supplying layer doped with impurities. The switching diodes are electrically coupled to the junction word line. The strain transistor is formed in the core/peri area of the substrate and acts as a driving transistor.
申请公布号 US8232160(B2) 申请公布日期 2012.07.31
申请号 US201213404481 申请日期 2012.02.24
申请人 PARK NAM KYUN;HYNIX SEMICONDUCTOR INC. 发明人 PARK NAM KYUN
分类号 H01L21/8234;H01L23/48 主分类号 H01L21/8234
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