发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To manufacture: a transistor in which a threshold voltage is controlled without using a back gate electrode, a circuit for controlling the threshold voltage and impurity doping; and a semiconductor device having excellent electrical properties, high reliability and less power consumption by use of the transistor. <P>SOLUTION: A gate electrode is used, having a compositionally-controlled tungsten oxide film. The composition or the like is adjusted by a deposition method of the tungsten oxide film thereby enabling control of a work function. A threshold value of a transistor can be controlled by using the work function controlled tungsten oxide film as a part of the gate electrode. A semiconductor device having excellent electrical properties, high reliability and less power consumption can be manufactured by using the threshold voltage controlled transistor. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012142569(A) |
申请公布日期 |
2012.07.26 |
申请号 |
JP20110274836 |
申请日期 |
2011.12.15 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
ENDO YUTA;SASAKI TOSHINARI;NODA KOSEI;SATO HITOMI;SATO YUHEI |
分类号 |
H01L29/786;C01G41/00;H01L21/28;H01L21/336;H01L29/423;H01L29/49 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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