发明名称 FAILURE DIAGNOSIS SYSTEM, SEMICONDUCTOR INTEGRATED CIRCUIT, AND FAILURE DIAGNOSIS METHOD
摘要 <P>PROBLEM TO BE SOLVED: To diagnose a failure by using a fixed number of an output terminal to specify a signal which becomes a cause of the failure, out of a plurality of input signals. <P>SOLUTION: A failure diagnosis system comprises: a first compressing circuit which has a first selection circuit selecting and outputting one of a first input test signal and a first expectation value which is an expectation value of the first input test signal, and a first logic circuit outputting a matching determination result of a second input test signal and an output signal from the first selection circuit to an output terminal; and a selection control circuit making the first selection circuit select the first expectation value if a first output result from the output terminal when the first selection circuit selects the first input test signal indicates an error, specifies the first input test signal as an error if a second output result from the output terminal when the first selection circuit selects the first expectation value indicates normal, accompanied with the first output result indicating the error, and specifies the second input test signal as the error if the second output result indicates the error. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012141231(A) 申请公布日期 2012.07.26
申请号 JP20110000035 申请日期 2011.01.04
申请人 RENESAS ELECTRONICS CORP 发明人 OTSUKA AKIRA
分类号 G01R31/28 主分类号 G01R31/28
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