发明名称 SYSTEMS AND METHODS FOR DETERMINING DEVICE TEMPERATURE
摘要 Circuitry for measuring and/or monitoring device temperature may include a first node coupled to ground, and a second node and a first resistor coupled in series to ground and in parallel to the first node. A first current driven to the first node and a second current driven to the second node can be selected such that a first voltage measured at the first node and a second voltage measured at the second node are substantially equal. The circuitry may also include a third node and a second resistor coupled in series to ground. A third current driven to the third node can be selected such that a third voltage measured at the third node is substantially equal to a reference voltage. Measures of the second and third currents and measures of the first and second resistors can be used to determine device temperature.
申请公布号 US2012183017(A1) 申请公布日期 2012.07.19
申请号 US20100868548 申请日期 2010.08.25
申请人 SCHNAITTER WILLIAM N. 发明人 SCHNAITTER WILLIAM N.
分类号 G01K7/01;G01K7/16 主分类号 G01K7/01
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