发明名称 Semiconductor Device and Method of Forming Vertical Interconnect Structure in Substrate for IPD and Baseband Circuit Separated by High-Resistivity Molding Compound
摘要 A semiconductor device is made with a conductive via formed through a top-side of the substrate. The conductive via extends vertically through less than a thickness of the substrate. An integrated passive device (IPD) is formed over the substrate. A plurality of first conductive pillars is formed over the first IPD. A first semiconductor die is mounted over the substrate. An encapsulant is formed around the first conductive pillars and first semiconductor die. A second IPD is formed over the encapsulant. An interconnect structure is formed over the second IPD. The interconnect structure operates as a heat sink. A portion of a back-side of the substrate is removed to expose the first conductive via. A second semiconductor die is mounted to the back-side of the substrate. The second semiconductor die is electrically connected to the first IPD and first semiconductor die through the conductive via.
申请公布号 US2012175784(A1) 申请公布日期 2012.07.12
申请号 US201213424484 申请日期 2012.03.20
申请人 STATS CHIPPAC, LTD. 发明人 LIN YAOJIAN;FANG JIANMIN;CHEN KANG;CAO HAIJING
分类号 H01L23/538 主分类号 H01L23/538
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