发明名称 METHODS TO ADJUST THRESHOLD VOLTAGE IN SEMICONDUCTOR DEVICES
摘要 Methods for forming a device on a substrate are provided herein. In some embodiments, a method of forming a device on a substrate may include providing a substrate having a partially fabricated first device disposed on the substrate, the first device including a first film stack comprising a first dielectric layer and a first high-k dielectric layer disposed atop the first dielectric layer; depositing a first metal layer atop the first film stack; and modifying a first upper surface of the first metal layer to adjust a first threshold voltage of the first device, wherein the modification of the first upper surface does not extend through to a first lower surface of the first metal layer.
申请公布号 US2012171855(A1) 申请公布日期 2012.07.05
申请号 US201113190012 申请日期 2011.07.25
申请人 WARD MICHAEL G.;PEIDOUS IGOR V.;CHIANG SUNNY;TA YEN B.;DARLAK ANDREW;PORSHNEV PETER I.;SRINIVASAN SWAMINATHAN;APPLIED MATERIALS, INC. 发明人 WARD MICHAEL G.;PEIDOUS IGOR V.;CHIANG SUNNY;TA YEN B.;DARLAK ANDREW;PORSHNEV PETER I.;SRINIVASAN SWAMINATHAN
分类号 H01L21/28 主分类号 H01L21/28
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