发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device which maintains excellent connectivity among solder bumps and inhibits a void generating in the solder bump after melting. <P>SOLUTION: A first substrate 2 having a first solder bump 1 and a second substrate 4 having a second solder bump 3 are laminated with the solder bumps 1, 3 being temporarily fixed to each other, and subsequently located in a furnace. After an inert gas is introduced into the furnace, a temperature of the furnace is raised to a temperature range over a melting temperature of the solder bumps 1, 3. The inert gas is discharged to create a reduced-pressure atmosphere with the temperature of the furnace being kept in the temperature range over the melting temperature of the solder bumps 1, 3. Thereafter, the melted first solder bump 1 and second solder bump 3 are integrated and bonded while removing an oxide film existing on surfaces of the first and second solder bumps 1, 3 by introduction of a carboxylic acid gas into the furnace. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012129482(A) 申请公布日期 2012.07.05
申请号 JP20100282287 申请日期 2010.12.17
申请人 TOSHIBA CORP 发明人 KOMUDA NAOYUKI
分类号 H01L21/60;B23K1/00;B23K1/008;B23K31/02;B23K101/40;H05K3/34;H05K3/36 主分类号 H01L21/60
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