DEVICE CHARACTERISTICS MEASUREMENT METHOD USING AN ALL-OPTOELECTRONIC TERAHERTZ PHOTOMIXING SYSTEM AND SPECTRAL CHARACTERISTICS MEASUREMENT METHOD OF TERAHERTZ MEASURING APPARATUS USING THE SAME

摘要

A device characteristics measurement method using an all-optoelectronic terahertz photomixing system includes: calculating power of an antenna of a transmitter by adding a matching condition between output impedance of the photomixer and input impedance of the antenna of the transmitter to power of the photomixer of the transmitter; calculating power of an antenna of a receiver based on the power of the antenna of the transmitter; and outputting the power of the antenna of the transmitter and the power of the antenna of the receiver so as to analyze device characteristics of the photomixer and the antenna of the transmitter.