发明名称 |
METHOD FOR ANALYZING SENSITIVITY AND FAILURE PROBABILITY OF A CIRCUIT |
摘要 |
A method is disclosed of determining a likelihood of failure of a circuit made in accordance with a circuit design based on at least one variable derived from measurements of a fabricated component or component combination included in the circuit design. Also disclosed is a processor configured to perform the method and a computer-readable medium storing method instructions. |
申请公布号 |
US2012167025(A1) |
申请公布日期 |
2012.06.28 |
申请号 |
US20100975585 |
申请日期 |
2010.12.22 |
申请人 |
GILLESPIE KEVIN M.;CORREIA TIMOTHY J.;PRIORE DONALD A.;ADVANCED MICRO DEVICES, INC. |
发明人 |
GILLESPIE KEVIN M.;CORREIA TIMOTHY J.;PRIORE DONALD A. |
分类号 |
G06F9/455 |
主分类号 |
G06F9/455 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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