发明名称 CONTINUOUS METAL SEMICONDUCTOR ALLOY VIA FOR INTERCONNECTS
摘要 A contact structure is disclosed in which a continuous metal semiconductor alloy is located within a via contained within a dielectric material. The continuous semiconductor metal alloy is in direct contact with an upper metal line of a first metal level located atop the continuous semiconductor metal alloy and at least a surface of each source and drain diffusion region located beneath the continuous metal semiconductor alloy. The continuous metal semiconductor alloy includes a lower portion that is contained within an upper surface of each source and drain region, and a vertical pillar portion extending upward from the lower portion.
申请公布号 US2012161212(A1) 申请公布日期 2012.06.28
申请号 US201213405739 申请日期 2012.02.27
申请人 COHEN GUY;DIMITRAKOPOULOS CHRISTOS D.;GRILL ALFRED;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COHEN GUY;DIMITRAKOPOULOS CHRISTOS D.;GRILL ALFRED
分类号 H01L29/78;B82Y99/00 主分类号 H01L29/78
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