发明名称 |
CONTINUOUS METAL SEMICONDUCTOR ALLOY VIA FOR INTERCONNECTS |
摘要 |
A contact structure is disclosed in which a continuous metal semiconductor alloy is located within a via contained within a dielectric material. The continuous semiconductor metal alloy is in direct contact with an upper metal line of a first metal level located atop the continuous semiconductor metal alloy and at least a surface of each source and drain diffusion region located beneath the continuous metal semiconductor alloy. The continuous metal semiconductor alloy includes a lower portion that is contained within an upper surface of each source and drain region, and a vertical pillar portion extending upward from the lower portion. |
申请公布号 |
US2012161212(A1) |
申请公布日期 |
2012.06.28 |
申请号 |
US201213405739 |
申请日期 |
2012.02.27 |
申请人 |
COHEN GUY;DIMITRAKOPOULOS CHRISTOS D.;GRILL ALFRED;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
COHEN GUY;DIMITRAKOPOULOS CHRISTOS D.;GRILL ALFRED |
分类号 |
H01L29/78;B82Y99/00 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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