TEST METHOD OF SEMICONDUCTOR DEVICE AND TEST SYSTEM OF SEMICONDUCTOR DEVICE

摘要

PURPOSE: A test method of a semiconductor device and a test system including the semiconductor device are provided to confirm optimum operation environment by changing operation environment of the semiconductor device and testing it. CONSTITUTION: A semiconductor device is tested whether it normally acts or not in a first action mode(S111). The semiconductor device is tested whether it normally acts or not in a second action mode in case the semiconductor device normally acts in the first action mode(S121). The semiconductor device is programmed so that it acts in the second action mode in case the semiconductor device normally acts in the second action mode(S122). The semiconductor device is tested whether it normally acts or not in a third action mode in case the semiconductor device normally acts in the second action mode(S131).