发明名称 A Faulty-Tester of the LED Chip
摘要 PURPOSE: An LED chip junction failure detecting apparatus is provided to determine whether a junction position which is wire-bonded is faulty or not while maintaining the failure detecting condition of an LED package array plate in the high temperature. CONSTITUTION: LED chips are installed in an LED package array plate. A lead of the LED chip package is arranged in the LED package array plate. A probe pin unit(3) is connected to the lead and sanctions electricity. A settlement plate(2) is applied a power source and is heated. The settlement plate heats the LED package array plate. The LED package array plate is settled in the settlement plate. A probe pin of the probe pin unit passes through a guiding hole(4).
申请公布号 KR101159965(B1) 申请公布日期 2012.06.25
申请号 KR20100050865 申请日期 2010.05.31
申请人 发明人
分类号 G01R31/02;H01L33/00 主分类号 G01R31/02
代理机构 代理人
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