发明名称 APPARATUS FOR DATA FLOW UNIT TESTING AND METHOD USING THE SAME
摘要 PURPOSE: A data flow unit testing apparatus and a method for the same are provided to identify and delete data defects included in java/C/C++ softwares. CONSTITUTION: A data test data generating part(210) identifies data defects of all variables. A data flow test path generating part(220) extracts path lists from the defined positions to the used positions of the variables and selectively executes one or more path lists. A path executing part(230) displays the execution result of the data flow path on a data flow graph. A test result report generating part(240) generates a coverage report with respect to the execution result of the data flow path.
申请公布号 KR20120067186(A) 申请公布日期 2012.06.25
申请号 KR20100128645 申请日期 2010.12.15
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 KIM, CHUL HONG;HAN, TAE MAN
分类号 G06F11/28;G06F19/00 主分类号 G06F11/28
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