发明名称 |
AUTOMATIC DEFECT MANAGEMENT IN MEMORY DEVICES |
摘要 |
A method for data storage in a memory including multiple memory cells arranged in blocks, includes storing first and second pages in respective first and second groups of the memory cells within a given block of the memory. A pattern of respective positions of one or more defective memory cells is identified in the first group. The second page is recovered by applying the pattern identified in the first group to the second group of the memory cells.
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申请公布号 |
US2012159281(A1) |
申请公布日期 |
2012.06.21 |
申请号 |
US201213405309 |
申请日期 |
2012.02.26 |
申请人 |
SHALVI OFIR;SOMMER NAFTALI;GOLOV OREN;ANOBIT TECHNOLOGIES LTD. |
发明人 |
SHALVI OFIR;SOMMER NAFTALI;GOLOV OREN |
分类号 |
H03M13/05;G06F11/10;H03M13/29 |
主分类号 |
H03M13/05 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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