发明名称 Method for inspecting substrate defect
摘要 PROBLEM TO BE SOLVED: To provide a substrate failure inspection method capable of improving efficiency of inspection and manufacturing steps by efficiently using substrate failure information. SOLUTION: A substrate failure inspection method comprises: a step of providing panel substrates partitioned into a plurality of unit substrates; a step of assigning specific numbers to the panel substrates; a step of performing a first step for the plurality of the unit substrates and inspecting whether each unit substrate is faulty; a step of matching the inspection result of the first step with the specific numbers and generating inspection data; a step of performing a second step for the plurality of the unit substrates and inspecting whether the unit substrates which received a good judgment in the first step are selectively faulty based on inspection data; and a step of adding the inspection result of the second step to the inspection data. COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 KR101156222(B1) 申请公布日期 2012.06.18
申请号 KR20100097015 申请日期 2010.10.05
申请人 发明人
分类号 H05K13/08 主分类号 H05K13/08
代理机构 代理人
主权项
地址
您可能感兴趣的专利