发明名称 Methods of self-aligned growth of chalcogenide memory access device
摘要 Self-aligning fabrication methods for forming memory access devices comprising a doped chalcogenide material. The methods may be used for forming three-dimensionally stacked cross point memory arrays. The method includes forming an insulating material over a first conductive electrode, patterning the insulating material to form vias that expose portions of the first conductive electrode, forming a memory access device within the vias of the insulating material and forming a memory element over the memory access device, wherein data stored in the memory element is accessible via the memory access device. The memory access device is formed of a doped chalcogenide material and formed using a self-aligned fabrication method.
申请公布号 US8198124(B2) 申请公布日期 2012.06.12
申请号 US20100652576 申请日期 2010.01.05
申请人 GREELEY NEIL;SRINIVASAN BHASKAR;SANDHU GURTEJ;SMYTHE JOHN;MICRON TECHNOLOGY, INC. 发明人 GREELEY NEIL;SRINIVASAN BHASKAR;SANDHU GURTEJ;SMYTHE JOHN
分类号 H01L21/00 主分类号 H01L21/00
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