发明名称 |
METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE |
摘要 |
A measurement method that includes irradiating a void-arranged structure on which an analyte has been held with an electromagnetic wave, detecting an electromagnetic wave scattered on the void-arranged structure, and determining a property of the analyte on the basis of at least one parameter, the parameter including the amount of change in the ratio of the detected electromagnetic wave to the irradiated electromagnetic wave at a specific frequency between the presence and the absence of the analyte. |
申请公布号 |
US2012137755(A1) |
申请公布日期 |
2012.06.07 |
申请号 |
US201213398016 |
申请日期 |
2012.02.16 |
申请人 |
TAKIGAWA KAZUHIRO;KONDO TAKASHI;KAMBA SEIJI;OGAWA YUICHI;NATIONAL UNIVERSITY CORPORATION, TOHOKU UNIVERSITY;MURATA MANUFACTURING CO., LTD. |
发明人 |
TAKIGAWA KAZUHIRO;KONDO TAKASHI;KAMBA SEIJI;OGAWA YUICHI |
分类号 |
G01N29/02 |
主分类号 |
G01N29/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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