发明名称 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent electrical characteristics from deteriorating due to interference between well regions. CONSTITUTION: A substrate(100) is divided into a first region(I) and a second region(II). A first gate structure(152) is formed on the substrate. The first gate structure includes a first gate insulating layer pattern(122), a first gate electrode(132), and a first gate mask(142). A first impurity region(102) is formed on an upper portion of the substrate adjacent to the first gate structure. A second gate structure(154) includes a second gate insulating layer pattern(124), a second gate electrode(134), and a second gate mask(144).
申请公布号 KR20120056956(A) 申请公布日期 2012.06.05
申请号 KR20100118456 申请日期 2010.11.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, PIL KYU;BAE, DAE LOK;CHOI, GIL HEYUN;BANG, SUK CHUL;PARK, BYUNG LYUL;MOON, KWANG JIN;LIM, DONG CHAN;JUNG, DEOK YOUNG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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