| 摘要 |
An apparatus, system, and method are disclosed for identifying and tracing of items within an assembly or manufacturing process. An individual item identifier (“ID”) is assigned to an item during one or more of an initial assembly step and a manufacturing step. A surface of the item is read to determine a first surface profile of the item which is associated with the individual item ID. The first surface profile and the individual item ID are stored in a database. The surface of the item is read to determine a second surface profile of the item after each manufacturing or assembling process step in which the surface of the item is manipulated. The second surface profile is compared with the first surface profile and the second surface profile is associated with the individual item ID in response to a mismatch between the first surface profile and the second surface profile.
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