发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND METHOD AND APPARATUS OF PROCESSING SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of preventing deterioration of the surface morphology of an Ni-containing film caused by dependence on an under layer and of forming a continuous film in a thin film region, and to provide a method and an apparatus of processing a substrate. <P>SOLUTION: The method includes: mounting a substrate into a processing vessel; and forming a nickel-containing film having a predetermined film thickness on the substrate by repeating, predetermined number of times, the cycle which includes a step of supplying a raw material including nickel and impurities into the processing vessel and a step of supplying an inert gas into the processing vessel. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012102404(A) 申请公布日期 2012.05.31
申请号 JP20110276868 申请日期 2011.12.19
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HARADA KAZUHIRO;ITAYA HIDEJI;HORII SADAYOSHI
分类号 C23C16/06;C23C16/02;H01L21/28;H01L21/285 主分类号 C23C16/06
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