发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND METHOD AND APPARATUS OF PROCESSING SUBSTRATE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of preventing deterioration of the surface morphology of an Ni-containing film caused by dependence on an under layer and of forming a continuous film in a thin film region, and to provide a method and an apparatus of processing a substrate. <P>SOLUTION: The method includes: mounting a substrate into a processing vessel; and forming a nickel-containing film having a predetermined film thickness on the substrate by repeating, predetermined number of times, the cycle which includes a step of supplying a raw material including nickel and impurities into the processing vessel and a step of supplying an inert gas into the processing vessel. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012102404(A) |
申请公布日期 |
2012.05.31 |
申请号 |
JP20110276868 |
申请日期 |
2011.12.19 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
HARADA KAZUHIRO;ITAYA HIDEJI;HORII SADAYOSHI |
分类号 |
C23C16/06;C23C16/02;H01L21/28;H01L21/285 |
主分类号 |
C23C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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