发明名称 Fault prediction method, fault prediction system, and image forming apparatus
摘要 A fault prediction method predicts a plurality of faults in a target device, and includes the steps of collecting internal information of the target device output from the target device, generating one or more criteria for defining a deviation from a normal state based on the collected internal information of the target device, incorporating the one or more criteria into a device state discriminator, identifying a deviation from a normal state in the target device according to the one or more criteria using the device state discriminator, and outputting a fault prediction as a result of the identifying step to a user. One or more of the steps are performed by a processor.
申请公布号 US8190037(B2) 申请公布日期 2012.05.29
申请号 US20090487835 申请日期 2009.06.19
申请人 NAKAZATO YASUSHI;SATOH OSAMU;UE KOHJI;YAMASHITA MASAHIDE;YAMANE JUN;RICOH COMPANY, LIMITED 发明人 NAKAZATO YASUSHI;SATOH OSAMU;UE KOHJI;YAMASHITA MASAHIDE;YAMANE JUN
分类号 G03G15/00 主分类号 G03G15/00
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