发明名称 SURFACE SHAPE MEASURING APPARATUS
摘要 PURPOSE: A surface shape measuring apparatus is provided to diminish a light saturation and light shortage when detecting light amount because the light amount irradiating to a sample having a different reflectivity is controlled on a pixel basis through a SLM(Spatial Light Modulator). CONSTITUTION: A surface shape measuring apparatus(100) comprises a light source(110), a SLM(120), a photodetector(130), and a control unit(140). The light source irradiates the light to a sample. The SLM is arranged in the optical path between the light source and sample. The SLM spatially controls amount of the light irradiated on the specimen on a pixel unit basis. The photodetector detects the light reflected from a sample. The control unit irradiates the lights to the sample by controlling the light amount by the SLM and detects the lights reflected from the sample.
申请公布号 KR20120053710(A) 申请公布日期 2012.05.29
申请号 KR20100114969 申请日期 2010.11.18
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD.;KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 MIN, JONG GOO;KIM, SEUNG WOO;WOU, JOON HO;GHIM, YOUNG SIK;JANG, HYUN JUN
分类号 G01B11/24;G02F1/01 主分类号 G01B11/24
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