发明名称 METHOD FOR FABRICATING VIA HOLE AND THROUGH-SILICON VIA
摘要 A method for fabricating a via hole includes forming a first mask pattern on a first surface of a wafer exposing a portion of the first surface of the wafer, forming a passivation region within the wafer by implanting impurities into the exposed portion of the wafer using the first mask pattern as an ion implantation barrier layer, forming an etching stop layer on the first surface of the wafer including the passivation regions, forming a second mask pattern on a second surface of the wafer faces away from the first surface of the wafer, wherein the second mask pattern exposes a portion of the second surface of the wafer over an area between the passivation regions, and forming a via hole by etching the wafer using the second mask pattern as an etching mask.
申请公布号 US2012129341(A1) 申请公布日期 2012.05.24
申请号 US201113187845 申请日期 2011.07.21
申请人 JO SEUNG HEE;KIM SEONG CHEOL;HYNIX SEMICONDUCTOR INC. 发明人 JO SEUNG HEE;KIM SEONG CHEOL
分类号 H01L21/28;H01L21/311 主分类号 H01L21/28
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