发明名称 Exposure apparatus
摘要 An exposure apparatus includes an alignment station where an alignment measurement process is executed, an exposure station where an exposure process is executed, and two stages which can be swapped between the alignment station and the exposure station. A first blowing unit blows temperature-adjusted gas toward the alignment station, and a second blowing unit blows temperature-adjusted gas toward the exposure station. The directions in which the first blowing unit and the second blowing unit blow the gases are substantially perpendicular to a direction along which the alignment station and the exposure station are arranged.
申请公布号 US8184261(B2) 申请公布日期 2012.05.22
申请号 US20080236630 申请日期 2008.09.24
申请人 AICHI SHINTARO;CANON KABUSHIKI KAISHA 发明人 AICHI SHINTARO
分类号 G03B27/52;G01B11/00;G03B27/42 主分类号 G03B27/52
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